Month: April 2026

Participation in competitions

Ge and Kiarash’s work on LLM-enabled manufacturing process modeling has been selected to present in the MIT Manufacturing Week 2026Research Showcase, an event co-led by the MIT Initiative for New Manufacturing (INM) and the NSF I-Corps New England Hub.

Kiarash’s poster on LLM-assisted defect detection and classification won the 3rd place in the UConn ME research competition, 2.5+ years group.